MANYETIC™️
Nanotech SolutionsMANYETIC™ is an user-friendly interface designed and develop to guide users during the procedure for AC magnetization measurements or AC magnetic field generation in AC Hyster™ and AC Gen Series, respectively. MANYETIC™ allows to easily customise user options and the integration of accessorial equipment, such as temperature controller or reading, in AC Hyster™ and AC Gen Series.
For AC GEN Series, MANYETIC™ offers different available measurement modes adapted to control cooling temperature and/or temperature reading accesories:
- AC GEN generator allows to generate AC magnetic fields at given field conditions (i.e. field frequency and intensity values).
- AC GEN temperature VS time allows to record the temperature from optical thermal probe versus time while AC magnetic field is ON or OFF.
- AC GEN cooling temperature settings allows to generate AC magnetic fields at given field conditions (i.e. field frequency and intensity values) while setting the temperature of the sample space between 10° and 50°C.
Measurement window showing the dynamical traces related to temperature, field intensity and frequency comparison. Field conditions : 100 kHz and 24 kA/m.
For AC Hyster™ Series, MANYETIC™ offers different available measurements adapted to the Advance, Sens and LF models:
Pop-up window showing the experimental measurements modalities offered by MANYETI™ for running AC Hyster™ series.
AC Magnetization Measurements (AC MAG Mode) to perform measurements of magnetization cycles, and magnetic losses. For this option, MANYETIC™ analyses the following magnetic hysteresis parameters out of the magnetization measurements under alternating magnetic fields: coercitive field (Hc), remanence (Mr), magnetization at the maximum field intensity (Mmax), magnetic area (A). Magnetic losses are also quantified from the magnetic area as the specific absorption rate (SAR): SAR = A∙f, where f is the field frequency employed. Each measurement consists in three repetitions of measuring the magnetization cycle, and MANYETIC™ provides the average value and the standard deviation.
Measurement window showing the comparison between reference curve (grey line) and real time AC magnetization measurement (red line) performed at 100 kHz and 24 kA/m.
Magnetization harmonics analysis (MHA Mode) to perform the analysis of odd magnetization amplitude and phase. For this option, MANYETIC™ analyses the following magnetic hysteresis parameters out of the magnetization measurements under alternating magnetic fields: the amplitude and phase of the odd magnetization harmonics (from 1st up to 15th index).
Measurement window showing the comparison between reference curve (grey line) and real time MHA amplitude (red columns) and phase (blue columns) measurements at 100 kHz and 24 kA/m.
The above measurement types can be performed by following three different modalities:
Pop-up window showing the measurements modes offered by MANYETIC™ for running AC Hyster™ series.
AC magnetic field conditions (AC MFC)
AC MFC mode allows to characterize one or several samples under different field conditions available in the AC Hyster™ settings. Thus, one can select:
1) Field Intensity dependence: USER must select one frequency and one or multiple field intensities.
2) Field frequency dependence: USER must select one or multiple field frequency values and one field intensity (whose value is available for all selected frequencies).
3) Free selection of field conditions: Free selection of single or multiple many field conditions (i.e. field frequency and intensity values).
This AC MFC mode allows to compare on real time the measurements with the a REFERENCE CURVE (previously recorded data) .
Multimeasurement (MM)
MM mode allows to set AC Hyster™ to measure several samples under same field conditions (field frequency and intensity values) in the same operational procedure. User must define: 1) Number of measurements to be performed; 2) selection of field frequency & intensity values for measurements.
AC MFC and MM modes allow to compare on real time the measurements with one REFERENCE CURVE (i.e. previously recorded data).
Multicomparison (MC)
MC mode is similar to MM mode but allows USERs to separately compare each measurement with a different REFERENCE CURVE. For that, USER must set: 1) Number of sampling points (i.e. measurements) to be performed; 2) field conditions (frequency and intensity values); 3) the CURVE REFERENCE to be separately compared for each measurements.
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40150 Villacastín (Spain)
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Nanotech Solutions S.L.
MANUFACTURING PLANT
Carretera Madrid 23
40150 Villacastín
(Spain)